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Microscopy
Light microscopy
Transmission Electron Microscopy (TEM)
Scanning Electron Microscopy (SEM)
Image analysis
Image analysis
Metallographical Analysis
Deconvolution
Extended-focus images (EFI)
Fast Fourier Transformation
Multi Image Alignment (MIA)
Discriminant analysis
Paper analysis (Papyrus)
Carbon Black Analysis
Weld Seam Inspection
Sugar Analysis
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» Image analysis
» Deconvolution
Deconvolution
Scattered light from above and below the plane of focus induces distortions and blurring in fluorescence- and bright-field microscopy. The deconvolution methods restore sharpness, resolution and details in the images.