• Image analysis
• Metallographical Analysis
• Deconvolution
• Extended-focus images (EFI)
• Fast Fourier Transformation
• Multi Image Alignment (MIA)
• Discriminant analysis
• Paper analysis (Papyrus)
• Carbon Black Analysis
• Weld Seam Inspection
• Sugar Analysis

Deconvolution

Scattered light from above and below the plane of focus induces distortions and blurring in fluorescence- and bright-field microscopy. The deconvolution methods restore sharpness, resolution and details in the images.