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Microscopy
Light microscopy
Transmission Electron Microscopy (TEM)
Scanning Electron Microscopy (SEM)
Image analysis
Image analysis
Metallographical Analysis
Deconvolution
Extended-focus images (EFI)
Fast Fourier Transformation
Multi Image Alignment (MIA)
Discriminant analysis
Paper analysis (Papyrus)
Carbon Black Analysis
Weld Seam Inspection
Sugar Analysis
» Home
» Microscopy
» Image analysis
» Fast Fourier Transformation
Fast Fourier Transformation (FFT)
FFT is a good way to remove interferences from a regular structure.
Transmission electron microscope image of a linegrating
FFT of the micrograph
Back filtered FFT micrograph without interferences
